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Condensed Matter Physics
Xu RuiSenior Engineer

Address:Room 104A,Physics Building

E-mail:ruixu@ruc.edu.cn

Phone:010-62513851

Fax:

Webpage:

Education

2005.09-2009.07 Bachelor of Physics, Beijing Normal University

2009.09-2015.07 Ph.D of Condensed Matter Physics, Beijing Normal University


Employment

2016.10-2016.12 Visiting Scholar, Osaka University

2015.07-2019.06 Assistant Professor, National Center for Nanoscience and Technology

2019.06-2021.06 Engineer, Renmin University of China

2021.06-present Senior Engineer, Renmin University of China


Research Interests

1 Surface interface study of two-dimensional materials

2 Advanced atomic force microscopy research


Achievement

She has long-term work experience and excellent working foundation in the field of scanning probe microanalysis technology, and has systematically carried out many aspects of research work by using functional imaging, spectroscopic measurement and atomic/molecular manipulation of scanning probe technology, and obtained a number of cutting-edge research results. She has published nearly 60 papers in internationally influential academic journals, and some of the research results have been published in well-known scientific journals such as Physical Review Letters, Nature Communications, and ACS Nano.

Selected Publications:

1.L Lei, YZ Lun, FY Cao, L Meng, SY Xing, JF Guo, HY Dong, SZ Gu, KQ Xu, S Hussain, YJ Li, Y Sugawara, F Pang, W Ji, JW Hong, R Xu, and ZH Cheng, “Size-dependent strain-engineered nanostructures in MoS2 monolayer investigated by atomic force microscopy”. Nanotechnology 32, 465703 (2021)

2. F Pang, FY Cao, L Lei, L Meng, SL Ye, SY Xing, JF Guo, HY Dong, S Hussain, SZ Gu, KQ Xu, YJ Li, Y Sugawara, W Ji, R Xu, ZH Cheng, "Strain-Engineering Rippling and Manipulation of Single Layer WS2 by Atomic Force Microscopy", Journal of Physical Chemistry C 125, 8696 (2021)

3. R Xu, F Pang, YH Pan, YZ Lun, L Meng, ZY Zheng, KQ Xu, L Lei, S Hussain, YJ Li, Y Sugawara, JW Hong, W Ji, ZH Cheng, "Atomically Asymmetric Inversion Scales up to Mesoscopic Single-Crystal Monolayer Flakes", ACS Nano 14, 13834-13840 (2020).

4. S Hussain, R Xu, KQ Xu, L Lei, L Meng, ZY Zheng, SY Xing, JF Guo, HY Dong, A Liaqat, M Iqbal, YJ Li, Y Sugawara, F Pang, W Ji, LM Xie, ZH Cheng, "Strain-Induced Hierarchical Ripples in MoS2 Layers Investigated by Atomic Force Microscopy",  Applied Physics Letters 117, 153102 (2020)

5. KQ Xu, YH Pan, SL Ye, L Lei, S Hussain, QM Wang, ZY Yang, XM Liu, W Ji, R Xu, ZH Cheng, "Shear Anisotropy-Driven Crystallographic Orientation Imaging in Flexible Hexagonal Two-Dimensional Atomic Crystals", Applied Physics Letters 115, 063101 (2019) (The article was featured by the editors, and Scilight of the American Physical Society also conducted a feature interview and published a review article on the work。Webpage: https://aip.scitation.org/doi/10.1063/1.5122952)

6. R Xu, XS Wang, ZY Zheng, SL Ye, KQ Xu, L Lei, S Hussain, F Pang, XM Liu, YJ Li, Y Sugawara, W Ji, LM Xie, ZH Cheng, “Interfacial Water Intercalation-Induced Metal-Insulator Transition in NbS2/BN Heterostructure”, Nanotechnology 29, 594-601 (2019)

7. KQ Xu, SL Ye, L Lei, L Meng, S Hussain, ZY Zheng, HR Zeng, W Ji, R Xu, ZH Cheng, “Dynamic interfacial mechanical-thermal characteristics of atomically thin two-dimensional crystals”, Nanoscale 10, 13548 (2018)

8. R Xu, SL Ye, KQ Xu, L Lei, S Hussain, ZY Zheng, F Pang, SY Xing, XM Liu, W Ji, ZH Cheng, “Nanoscale charge transfer and diffusion at the MoS2/SiO2 interface by atomic force microscopy: contact injection versus triboelectrification”, Nanotechnology 29, 355701 (2018)

9. R Xu, Z Zheng, W Ji, Z Cheng, "Advanced scanning microwave microscopy" Progress in Physics 35, 241 (2015).

10. R Xu, LJ Yin, JB Qiao, KK Bai, JC Nie, L He, "Direct probing stacking order and electronic spectrum of rhombohedral trilayer graphene with scanning tunelling microscopy", Physical Review B 91, 035410 (2015).

Patent:

1.ZL201610178483.3,“利用STM的电流信号对AFM信号进行测量的系统”

2.ZL202110017122.1,“振幅调制静电力显微术测量电学特性的方法及装置” 

3.ZL20201156692.6,“一种基于静电力显微镜的宽屏电学检测方法、系统和可读介质”